Filterless vacuum ultraviolet photoconductive detector fabricated on NdF3 thin film

The NdF
₃
thin film grown at 670 K exhibited the maximum photocurrent and the response below 180 nm in sensitivity spectrum. Moreover, the increase in current achieved 4-digit growth before and after VUV illumination. These observed characteristics open up the possibility of high sensitive VUV photoconductive detectors using fluorides.